Free Workshop: Maximize the Outcome of EDS Analysis

* Booth session are identical. Due to limited seats registration will be only possible until April 11th.

Where?
Cranfield Microscopy Services, Building 39, Cranfield University, Bedfordshire MK43 0AL

EXPLORE LOCATION

What to expect?
This workshop offers valuable insights for researchers and practitioners in the field of EDS analysis and comprises presentations and live demonstrations at the microscope. We will address the difficulties to achieve quantitative microanalysis without compromise when dealing with nanostructure, low X-ray yield, beam sensitivity, challenging samples, …
And present solutions to enhance spectral quality and spatial resolution to turn poor spectra into high-resolution mapping.

Achieve precise results with individually optimized EDS geometry and more efficient X-ray collection, for:

 unmatched speed (maximize throughput) and precision

 minimized background and absorption

 detect smaller quantities with better detection limit

 more accurate quantification

 facilitate the analysis of challenging samples

Everything using the seamless integration of EDS, WDS, EBSD, and Micro-XRF in the ESPRIT analysis platform for any SEM, FIB-SEM and EPMA.

The workshop will be held in small groups, with a live session at the Scanning Electron Microscope, providing a hands-on opportunity to delve into EDS. We encourage you to bring your samples for analysis, as this will foster a collaborative environment for sharing insights and discovering solutions together. Seats are limited so register now and secure your seat! Lunch will be provided to workshop attendees. We look forward to your participation and the valuable contributions you will bring to this collaborative event!

Figure 1: High input count rate EDS map of a welding seam of zirconium and stainless steel.

Who should attend?

 Electron Micrcoscopy facility staff

 Academics focused on Electron Microscopy

Our Speaker

Dr. Igor Németh Application Scientist EDS Bruker Electron Microscope Analyzers

Register to save your spot now. Due to limited spots registration is possible until April 11th

Figure 1: High input count rate EDS map of a welding seam of zirconium and stainless steel.

Title First Column

Lorem Ipsum is simply dummy text of the printing and typesetting industry. Lorem Ipsum has been the industry's standard dummy text ever since the 1500s, when an unknown printer took a galley of type and scrambled it to make a type specimen book.

Title Second Column

Lorem Ipsum is simply dummy text of the printing and typesetting industry. Lorem Ipsum has been the industry's standard dummy text ever since the 1500s, when an unknown printer took a galley of type and scrambled it to make a type specimen book.

Title Second Column

Lorem Ipsum is simply dummy text of the printing and typesetting industry. Lorem Ipsum has been the industry's standard dummy text ever since the 1500s, when an unknown printer took a galley of type and scrambled it to make a type specimen book.

Title Second Column

Lorem Ipsum is simply dummy text of the printing and typesetting industry. Lorem Ipsum has been the industry's standard dummy text ever since the 1500s, when an unknown printer took a galley of type and scrambled it to make a type specimen book.

WELCOME

Lorem Ipsum is simply dummy text of the printing and typesetting industry. Lorem Ipsum has been the industry's standard dummy text ever since the 1500s, when an unknown printer took a galley of type and scrambled it to make a type specimen book.